Analysis of the X-ray spectrum of source 422

X-ray spectrum of source 767 in Nandra et al. (submitted), X-ray ID 422.

Please refer to Buchner et al. (2014) for the spectral analysis method. The spectral fitting parameters (intrinsic luminosity, obscuring column density NH, soft scattering powerlaw fraction, redshift) are not published yet (contact Johannes Buchner)

To the photometry and SED fitting of this source
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