Publications of Miranda Bradshaw

Barrière, N. M.; Babić, L.; Bayerle, A.; Castiglione, L.; Collon, M. J.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E.; Jenkins, Y. et al.; Landgraf, B.; Keek, L.; Okma, B.; Serano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Riekerink, M. O.; Haneveld, J.; Schurink, B.; Start, R.; van Baren, C.; Handick, E.; Krumrey, M.; Valsecchi, G.; Bradshaw, M.; Burwitz, V.: Assembly of confocal Silicon Pore Optics mirror modules. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Landgraf, B.; Babić, L.; Barrière, N. M.; Bayerle, A.; Castiglione, L.; Collon, M. J.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E. et al.; Jenkins, Y.; Keek, L.; Okma, B.; Serano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Shortt, B.; Riekerink, M. O.; Haneveld, J.; Koelewijn, A.; Wijnperlé, M.; Lankwarden, J.-J.; Schurink, B.; Start, R.; van Baren, C.; Hieltjes, P.; den Herder, J.-W.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Kailla, G.; Phillips, G.; Mundon, W.; Chequer, I.; Ball, K.: SPO mirror plate production and coating. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Collon, M. J.; Babic, L.; Barrière, N. M.; Bayerle, A.; Castiglione, L.; Eenkhoorn, N.; Girou, D.; Günther, R.; Hauser, E.; Jenkins, Y. et al.; Landgraf, B.; Keek, L.; Okma, B.; Serrano, G. M.; Thete, A.; Vacanti, G.; Verhoeckx, S.; Vervest, M.; Voruz, L.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Ferreira, I.; Fransen, S.; Shortt, B.; Riekerink, M. O.; Haneveld, J.; Koelewijn, A.; Wijnperle, M.; Lankwarden, J.-J.; Schurink, B.; Start, R.; van Baren, C.; Hieltjes, P.; den Herder, J.-W.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Kailla, G.; Mundon, W.; Philips, G.; Ball, K.: Silicon Pore Optics X-ray mirror development for the ATHENA telescope. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Bavdaz, M.; Wille, E.; Ayre, M.; Ferreira, I.; Shortt, B.; Fransen, S.; Millinger, M.; Collon, M. J.; Vacanti, G.; Barriere, N. M. et al.; Landgraf, B.; Riekerink, M. O.; Haneveld, J.; Start, R.; van Baren, C.; Ferreira, D. D. M.; Massahi, S.; Svendsen, S.; Christensen, F.; Krumrey, M.; Handick, E.; Burwitz, V.; Bradshaw, M.; Pareschi, G.; Valsecchi, G.; Vernani, D.; Kailla, G.; Mundon, W.; Phillips, G.; Schneider, J.; Korhonen, T.; Sanchez, A.; Heinis, D.; Colldelram, C.; Torti, M.; Willingale, R.: ATHENA x-ray optics development and accommodation. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Bradshaw, M.; Burwitz, V.; Hartner, G.; Langmeier, A.; Müller, T.; Rukdee, S.; Schmidt, T.; Girou, D.; Vacanti, G.; Collon, M. J. et al.; Ferreira, I.: Effect of particulate contamination on a silicon pore optic. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Rukdee, S.; Burwitz, V.; Hartner, G.; Müller, T.; Schmidt, T.; Langmeier, A.; Bradshaw, M.: X-ray ray tracing with Zemax for the PANTER testing facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy X, Vol. 11822. SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 01, 2021 - August 05, 2021. (2021)

Bradshaw, M.; Burwitz, V.; Friedrich, P.; Hartner, G.; Langmeier, A.; Valsecchi, G.; Vernani, D.; Chen, Y.: X-ray testing of the Einstein Probe follow-up x-ray telescope STM at MPE’s PANTER facility. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Vol. 11444, 1144457 . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, December 14, 2020 - December 18, 2020. (2020)

Burwitz, V.; Bradshaw, M.; Eder, J.; Breunig, E.; Ayre, M.; Bavdaz, M.; Ferreira, I.: Design of a new long beam x-ray test facility for ATHENA. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Vol. 11444, 114444L . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, December 14, 2020 - December 18, 2020. (2020)

Heilmann, R. K.; Bruccoleri, A. R.; Song, J.; Cook, M. T.; Gregory, J. A.; Lambert, R. D.; Shapiro, D. A.; Young, D. J.; Bradshaw, M.; Burwitz, V. et al.; Hartner, G. D.; Langmeier, A.; Smith, R. K.; Schattenburg, M. L.: Towards volume manufacturing of high-performance soft x-ray critical-angle transmission gratings. In: Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, Vol. 11444, 114441H . Conference on Space Telescopes and Instrumentation - Ultraviolet to Gamma Ray / SPIE Astronomical Telescopes + Instrumentation Conference, ELECTR NETWORK, December 14, 2020 - December 18, 2020. (2020)

Pareschi, G.; Civitani, M.; Sironi, G.; Yang, Y.; Cotroneo, V.; Valsecchi, G.; Magagnin, L.; Döhring, T.; Bradshaw, M.; Burwitz, V. et al.; Pelliciari, C.: Soft x-ray reflectivity-enhancement in astronomical telescopes via overcoatings: alternative materials and deposition methods. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 111190S (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)

Collon, M. J.; Vacanti, G.; Barrière, N. M.; Landgraf, B.; Günther, R.; Vervest, M.; Voruz, L.; Verhoeckx, S.; Babić, L.; Keek, L. et al.; Girou, D.; Okma, B.; Hauser, E.; Beijersbergen, M. W.; Bavdaz, M.; Wille, E.; Fransen, S.; Shortt, B.; Ferreira, I.; Haneveld, J.; Koelewijn, A.; Start, R.; Wijnperle, M.; Lankwarden, J.-J.; van Baren, C.; Hieltjes, P.; den Herder, J. W.; Müller, P.; Handick, E.; Krumrey, M.; Bradshaw, M.; Burwitz, V.; Pareschi, G.; Massahi, S.; Svendsen, S.; Ferreira, D. D. M.; Christensen, F. E.; Valsecchi, G.; Oliver, P.; Chequer, I.; Ball, K.: Status of the silicon pore optics technology. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 111190L (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)

Bradshaw, M.; Burwitz, V.; Hartner, G.; Pelliciari, C.; Langmeier, A.; Liao, Y.; Friedrich, P.; Valsecchi, G.; Barričre, N.; Collon, M. J. et al.; Vacanti, G.: Developments in testing x-ray optics at MPE's PANTER facility. In: Optics for EUV, X-Ray, and Gamma-Ray Astronomy IX, Vol. 11119, 1111916 (Eds. O'Dell, S. L.; Pareschi, G.). SPIE OPTICAL ENGINEERING + APPLICATIONS, San Diego, CA, August 11, 2019 - August 15, 2019. (2019)