Publications of Tobias Kratschmann

Lippa, M.; Gillessen, S.; Blind, N.; Kok, Y.; Yazıcı, Ş.; Weber, J.; Pfuhl, O.; Haug, M.; Kellner, S.; Wieprecht, E. et al.; Eisenhauer, F.; Genzel, R.; Hans, O.; Haußmann, F.; Huber, D.; Kratschmann, T.; Ott, T.; Plattner, M.; Rau, C.; Sturm, E.; Waisberg, I.; Wiezorrek, E.; Perrin, G.; Perraut, K.; Brandner, W.; Straubmeier, C.; Amorim, A.: The metrology system of the VLTI instrument GRAVITY. In: Optical and Infrared Interferometry and Imaging V, 990722, pp. 1 - 9 (Eds. Malbet, F.; Creech-Eakman, M. J.; Tuthill, P. G.). Optical and Infrared Interferometry and Imaging V, Edinburgh, UK, June 26, 2016. (2016)