
Publikationen von Tobias Kratschmann
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Konferenzbeitrag (1)
1.
Konferenzbeitrag
The metrology system of the VLTI instrument GRAVITY. In: Optical and Infrared Interferometry and Imaging V, 990722, S. 1 - 9 (Hg. Malbet, F.; Creech-Eakman, M. J.; Tuthill, P. G.). Optical and Infrared Interferometry and Imaging V, Edinburgh, UK, 26. Juni 2016. (2016)