Publications of Norbert Krause

Holl, P.; Fischer, P.; Hartmann, R.; Hasinger, G.; Kollmer, J.; Krause, N.; Lechner, P.; Lutz, G.; Meidinger, N.; Peric, I. et al.; Richter, R.; Soltau, H.; Strüder, L.; Treis, J.; Trümper, J.; Wermes, N.: Active pixel sensors for imaging X-ray spectrometers. In: X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, pp. 770 - 778 (Eds. Trümper, J. E.; Tananbaum, H. D.). X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, Waikoloa, Hawaii, USA, August 24, 2002 - August 28, 2002. SPIE, Bellingham (2003)

Meidinger, N.; Bonerz, S.; Bräuninger, H.; Eckhardt, R.; Englhauser, J.; Hartmann, R.; Hasinger, G.; Holl, P.; Krause, N.; Lutz, G. et al.; Pfeffermann, E.; Richter, R.; Soltau, H.; Strüder, L.; Trümper, J.: Frame store PN-CCD detector for the ROSITA mission. In: X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, pp. 1040 - 1047 (Eds. Trümper, J. E.; Tananbaum, H. D.). X-Ray and Gamma-Ray Telescopes and Instruments for Astronomy, Waikoloa, Hawaii, USA, August 24, 2002 - August 28, 2002. SPIE, Bellingham (2003)

Meidinger, N.; Bonerz, S.; Eckhardt, R.; Englhauser, J.; Hartmann, R.; Hasinger, G.; Holl, P.; Krause, N.; Lutz, G.; Richter, R. et al.; Soltau, H.; Strüder, L.; Trümper, J.: First measurements with a frame store PN-CCD X-ray detector. Proceedings of the 9th European Symposium on Semiconductor Detect ors: New Developments on Radiation Detectors, Elmau, Germany, October 11, 2003. Proceedings of the 9th European Symposium on Semiconductor Detect ors: New Developments on Radiation Detectors, pp. 341 - 349 (2003)

Strüder, L.; Hasinger, G.; Kollmer, J.; Krause, N.; Meidinger, N.; Trümper, J.; Hartmann, R.; Holl, P.; Lechner, P.; Soltau, H. et al.; Klein, P.; Lutz, G.; Richter, R. H.; Fischer, P.; Wermes, N.; Buttler, W.: Imaging spectrometers for future X-ray missions. In: X-Ray and Gamma-Ray Instrumentation for Astronomy XII, pp. 41 - 49 (Eds. Flanagan, K. A.; Siegmund, O. H.W.). X-Ray and Gamma-Ray Instrumentation for Astronomy XII, San Diego, USA, July 31, 2001 - August 02, 2001. SPIE, Bellingham (2002)

Strüder, L.; Soltau, H.; Bonerz, S.; Bräuninger, H.; Carathanassis, D.; Eckhardt, R.; Hartmann, R.; Hasinger, G.; Holl, P.; Krause, N. et al.; Lutz, G.; Meidinger, N.; Richter, R. H.; Schaller, G.; Schnecke-Radau, M.; Trümper, J.: High speed, large format X-ray CCDs for ESA's XEUS mission. In: X-Ray and Gamma-Ray Instrumentation for Astronomy XII, pp. 61 - 69 (Eds. Flanagan, K. A.; Siegmund, O. H.W.). X-Ray and Gamma-Ray Instrumentation for Astronomy XII, San Diego, USA, July 31, 2001 - August 02, 2002. SPIE, Bellingham (2002)

Briel, U. G.; Bihler, E.; Bräuninger, H.; Colli, M.; Dennerl, K.; Haberl, F.; Hartmann, R.; Hartner, G.; Holl, P.; Meidinger, N. et al.; Kemmer, J.; Kendziorra, E.; Kirsch, M.; Krause, N.; Kuster, M.; Pal, J.; Pfeffermann, E.; Popp, M.; Reppin, C.; Stadelbauer, T.; Soltau, H.; Strüder, L.; Trümper, J.; v. Zanthier, C.; Zavlin, V. E.: Overview of the calibration and the performance of the PN-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, pp. 215 - 219 (Eds. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, July 21, 1999 - July 23, 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)

Dennerl, K.; Briel, U. G.; Haberl, F.; Hartner, G.; Krause, N.; Popp, M.; Zavlin, V. E.: Determination and correction of the charge transfer efficiency of the pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, pp. 232 - 243 (Eds. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, July 21, 1999 - July 23, 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)

Krause, N.; Briel, U. G.; Dennerl, K.; Soltau, H.; Strüder, L.; Zavlin, V. E.: The physical model of the charge transfer loss of the pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, pp. 220 - 230 (Eds. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, July 21, 1999 - July 23, 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)

Meidinger, N.; Bräuninger, H.; Briel, U.; Hartmann, R.; Hartner, G.; Holl, P.; Kemmer, J.; Kendziorra, E.; Krause, N.; Lutz, G. et al.; Pfeffermann, E.; Popp, M.; Reppin, C.; Richter, R.; Soltau, H.; Stötter, D.; Strüder, L.; Trümper, J.; von Zanthier, C.: The PN-CCD detector for XMM and ABRIXAS. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, pp. 192 - 203 (Eds. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, July 21, 1999 - July 23, 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)

Pal, J.; Kuster, M.; Kendziorra, E.; Krause, N.: The influence of optical light on the charge transfer efficiency of the XMM EPIC pn-CCD camera. In: EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, pp. 683 - 692 (Eds. Siegmund, O.H.W.; Flanagan, K.A.). EUV, X-ray and Gamma-Ray Instrumentation for Astronomy X, Denver, Colorado, USA, July 21, 1999 - July 23, 1999. Society of Photo-Optical Instrumentation Engineers, Bellingham, Wash., USA (1999)

Strüder, L.; Bräuninger, H.; Briel, U.; Hartmann, R.; Hartner, G.; Hauff, D.; Krause, N.; Maier, B.; Meidinger, N.; Pfeffermann, E. et al.; Popp, M.; Reppin, C.; Richter, R.; Stötter, D.; Trümper, J.; Weber, U.; Holl, P.; Kemmer, J.; Soltau, H.; Viehl, A.; Zanthier, C. v.: A 36 cm² large monolythic pn-CCD X-ray detector for the European XMM Satellite Mission. In: Workshop Proceedings: 1997 IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, pp. R19-1 - R19-4. IEEE Workshop on Charge-Coupled Devices and Advanced Image Sensors, Bruges, Belgium, June 05, 1997 - June 07, 1997. Institute of Electrical and Electronics Engineers, Bruges, Belgium (1997)

Soltau, H.; Krause, N.; Meidinger, N.; Hauff, D.; Krisch, S.; Strüder, L.; Zanthier, C. v.: Defect induced charge transfer losses in high resistivity float zone silicon charge coupled devices. In: Proceedings of the 4th International Symposium on High Purity Silicon, pp. 325 - 337 (Ed. Claeys, C.L.). 4th International Symposium on High Purity Silicon, San Antonio, TX, USA, October 06, 1996 - October 11, 1996. Electrochemical Society (1996)