Publikationen von Thomas F. Bechteler

Altmann, A.; Bechteler, T. F.; Lechner, P.; Fiorini, C.; Nandra, K.: Characterization and Setting of Fast Multiplexing Readout Electronics for a Multicell Silicon Drift Detector Used in X-Ray Spectroscopy. IEEE TRANSACTIONS ON NUCLEAR SCIENCE 71 (2), S. 184 - 195 (2024)